Electron Beam Probe Analysis
Fast, Accurate, and Quick Turn-around Probing
Nano Measurements provides fast, accurate design debugging,
yield, and failure analysis through the 10000da E-beam testing
system.
Electron-Beam (E-Beam) probing technology offers a superior alternative to traditional
probing by providing reliable, real-time data acquisition. Using contactless,
nonloading probing for measuring precise timing events, E-Beam technology is a
proven technique that enables companies to meet the challenges of designing, testing,
and debugging devices with higher pin counts and ever-shrinking design dimensions.
NANO Measurements ensures quick-turn E-beam service through its large inventory
of Device Under Test (DUT) bench test modules, thus drastically reducing the large
test lead-times and higher hardware costs of our competitors in E-beam analysis.
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The
IDS 10000da
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IDS 10000da design analysis system (E-Beam) is the state-of-the-art standard for
meeting the analysis challenges of ever-increasing pin counts and shrinking design
dimensions.
The IDS 10000da is the only E-Beam probe system capable of providing the high
level of accuracy and performance needed to debug sub-0.12 micron designs. With
unparalleled performance at 9GHz bandwidth with +/- 40ps accuracy and 2.5ps timing
resolution, only the IDS 10000da provides the accuracy required to probe the latest
technology devices. |
